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You searched IISERK - Title: Scattering and inverse scattering in pure and applied science |
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Scaling of Differential Equations [electronic resource] / by Hans Petter Langtangen, Geir K. Pedersen.
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Scaling, self-similarity, and intermediate asymptotics / Grigory Isaakovich Barenblatt.
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Scallops [electronic resource] : biology, ecology, and aquaculture / edited by Sandra E. Shumway, G. Jay Parsons.
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Scan Statistics [electronic resource] : Methods and Applications / edited by Joseph Glaz, Vladimir Pozdnyakov, Sylvan Wallenstein.
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Scanning electron microscopy : physics of image formation and microanalysis / Ludwig Reimer.
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Scanning Microscopy for Nanotechnology [electronic resource] : Techniques and Applications / edited by Weilie Zhou, Zhong Lin Wang.
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Scanning Probe Microscopy & Spectroscopy
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Scanning Probe Microscopy and Spectroscopy : Methods and Applications / Roland Wiesendanger.
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Scanning probe microscopy : atomic scale engineering by forces and currents / A. Foster, W. Hofer.
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Scanning Probe Microscopy [electronic resource] : Atomic Scale Engineering by Forces and Currents / by Adam Foster, Werner Hofer.
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