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You searched IISERK - Title: Scanning Probe Microscopy [electronic resource] : Atomic Scale Engineering by Forces and Currents / by Adam Foster, Werner Hofer. |
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Scan Statistics [electronic resource] : Methods and Applications / edited by Joseph Glaz, Vladimir Pozdnyakov, Sylvan Wallenstein.
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Scanning electron microscopy : physics of image formation and microanalysis / Ludwig Reimer.
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Scanning Microscopy for Nanotechnology [electronic resource] : Techniques and Applications / edited by Weilie Zhou, Zhong Lin Wang.
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Scanning Probe Microscopy & Spectroscopy
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Scanning Probe Microscopy and Spectroscopy : Methods and Applications / Roland Wiesendanger.
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Scanning probe microscopy : atomic scale engineering by forces and currents / A. Foster, W. Hofer.
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Scanning Probe Microscopy [electronic resource] : Atomic Scale Engineering by Forces and Currents / by Adam Foster, Werner Hofer.
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Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials [electronic resource] : Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002 / edited by Paula Maria Vilarinho, Yossi Rosenwaks, Angus Kingon.
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Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale / edited by Sergei Kalinin, Alexei Gruverman.
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Scanning Probe Microscopy [electronic resource] : Electrical and Electromechanical Phenomena at the Nanoscale / edited by Sergei Kalinin, Alexei Gruverman.
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