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You searched IISERK - Title: Schrödinger [electronic resource] : Centenary Celebration of a Polymath / Edited by C. W. Kilmister. |
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Scanning probe microscopy : atomic scale engineering by forces and currents / A. Foster, W. Hofer.
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Scanning Probe Microscopy [electronic resource] : Atomic Scale Engineering by Forces and Currents / by Adam Foster, Werner Hofer.
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Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials [electronic resource] : Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002 / edited by Paula Maria Vilarinho, Yossi Rosenwaks, Angus Kingon.
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Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale / edited by Sergei Kalinin, Alexei Gruverman.
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Scanning Probe Microscopy [electronic resource] : Electrical and Electromechanical Phenomena at the Nanoscale / edited by Sergei Kalinin, Alexei Gruverman.
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Scanning probe microscopy in nanoscience and nanotechnology / Bharat Bhushan, editor.
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Scanning SQUID Microscope for Studying Vortex Matter in Type-II Superconductors [electronic resource] / by Amit Finkler.
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Scattering and diffraction in physical optics / Manuel Nieto-Vesperinas.
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Scattering and inverse scattering in pure and applied science
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Scattering and Structures [electronic resource] : Essentials and Analogies in Quantum Physics / by Bogdan Povh, Mitja Rosina.
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