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| You searched IISERK - Title: Applied scanning probe methods VIII : scanning probe microscopy techniques / [edited by] Bharat Bhushan, Harald Fuchs, Masahiko Tomitori. |
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Applied Scanning Probe Methods VIII [electronic resource] : Scanning Probe Microscopy Techniques / edited by Bharat Bhushan, Harald Fuchs, Masahiko Tomitori.
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Applied scanning probe methods X : biomimetics and industrial applications / [edited by] Bharat Bhushan, Harald Fuchs, Masahiko Tomitori.
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Applied Scanning Probe Methods X [electronic resource] : Biomimetics and Industrial Applications / edited by Bharat Bhushan, Masahiko Tomitori, Harald Fuchs.
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Applied Scanning Probe Methods XI [electronic resource] : Scanning Probe Microscopy Techniques / by Bharat Bhushan, Harald Fuchs.
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Applied Scanning Probe Methods XIII [electronic resource] : Biomimetics and Industrial Applications / edited by Bharat Bhushan, Harald Fuchs.
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Applied Scanning Probe Methods XIII [electronic resource] : Characterization / edited by Bharat Bhushan, Harald Fuchs.
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Applied sedimentology [electronic resource] / Richard C. Selley.
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Applied Semi-Markov Processes [electronic resource] / by Jacques Janssen, Raimondo Manca.
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Applied Simulation and Optimization 2 [electronic resource] : New Applications in Logistics, Industrial and Aeronautical Practice / edited by Miguel Mujica Mota, Idalia Flores De La Mota.
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Applied Simulation and Optimization [electronic resource] : In Logistics, Industrial and Aeronautical Practice / edited by Miguel Mujica Mota, Idalia Flores De La Mota, Daniel Guimarans Serrano.
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